Léti’s nanocharacterization platform is slated to get a new transmission electron microscope (TEM) by August 2010. This microscope, a Titan Pico from FEI, will provide atomic-scale images with resolutions well below 0.1 nm. It is equipped with new technology that can correct optical distortions and allow enhanced characterization of nanomaterials and nanosystems. The purchase is part of Léti’s investment strategy for the platform and will be 100% financed by the French Ministry of Research’s basic technology research program. The microscope will be the only one of its kind in France, and will be backed by a partnership with FEI and a new joint CEA-Léti lab.
Contact: pascale.bayle-guillemaud@cea.fr
