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October 08 2019

3D reconstruction of nanometric objects from stereoscopic electron microscope images

Keywords : Images treatment, GPU programmation, optimisation, inverse problem, stereovision, neural networks. Robust, non-destructive and fast 3D metrology is a world-wide major challenge of microelectronics industry for defects inspection, optical lithography fidelity and process control. Fast reconstruction methods from stereoscopic electron microscope (SEM) images based on geometrical considerations allow to reconstruct 3D topography of micronic […] >>

October 08 2019

Van der Waals epitaxy of CdTe on 2D materials

2D materials nowadays attract a great amount of research because of their unique properties directly derived from their graphene-like electronic structure and crystalline organization. These materials have strong in-plane chemical bounds while extremely weak, van der Waals type, out-of-plane interaction describing them a 2D sheets of monolayer material. 2D material epitaxy on conventional 3D semiconductors […] >>

October 08 2019

Study and design of an integrated system for the automatic calibration of dispersions within a transducers array and application to a PMUT array

The purpose of this thesis is to study and design an integrated electronic system dedicated to the automatic and continuous compensation of dispersions within a MEMS (Microelectromechanical Systems) array. With the dissemination and the continual expansion of Internet of Things (IoT) and Cyber-Physical Systems (CPS), man-machine and machine-machine interfaces require increasingly efficient and sophisticated sensors. […] >>

October 08 2019

MEMS mirror for LIDAR in autonomous vehicules

Optical MEMS (MOEMS) are more and more asked, in particular for the autonomous car, which has to have mapping possibilities in order to detect obstacles (like a LIDAR – “LIGHT Detection And Ranging”). It consists in scanning the environment with a laser beam and in measuring the distance between the LIDAR and the point where […] >>

October 08 2019

Improvement of performance X and gamma-ray imaging by identification of semiconducting detector parameters

Our laboratory designs X and gamma-ray imaging systems for medical imaging or luggage control. We use CdTe or CdZnTe-based detectors that are sensitive to five physical parameters of the interaction: deposited energy E, interaction time T and the 3-dimensional position XYZ. These parameters are estimated by real-time analysis of anode electronics signals. These detectors have […] >>
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