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24 results found


Monitoring of high temperature effects on CMOS circuits

Offer N°: SL-DRT-15-0083

Start date: 1 Sep 2015

Deep sub-micron technologies become unavoidable even for critical applications in fields like automotive or nuclear industry. This evolution may have an important impact on the reliability of electronic systems involved in such applications in the absence of pro-active mitigation approaches.


Dopant characterization by X-ray microanalysis at the nano-scale

Offer N°: SL-DSM-15-0202

Start date: 1 Oct 2015

Doping is a key element in the development of modern semiconductor technology for applications in electronic, nano-electronics, optoelectronics and photonics. However, to date there is no “quick-and-easy” technique allowing direct and reliable characterization of low-levels of dopants in nanomaterials.


Dynamic control of cell division by optical microcavity

Offer N°: SL-DSM-15-0040

Start date: 1 Sep 2015

Radiation pressure is the force exerted by the light when meeting or propagating through an object. This force, however small, may allow you to move or manipulate objects of micrometric size like mini tweezers. Usually implemented through a microscope, they are called optical tweezers.


Correlations in TeraHertz quantum nanoelectronics

Offer N°: SL-DSM-15-0074

Start date: 1 Sep 2015

Understanding the many-body correlations of interacting systems remains the major challenge of contemporary theoretical physics with applications ranging from the calculation of the proton mass (quark-gluon plasma) to the understanding of the origin of high critical temperature superconductivity. Extremely sophisticated quantum field theory techniques have been developed to tackle this problem. They involve tedious algebra, overwhelming bookkeeping and often uncontrolled approximations.

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