Real-time calibration of a video stream on an embedded platform
Offer N°: SL-DRT-15-0386
This thesis investigates camera calibration methods in a real-time embedded context. The main goal is to propose an innovative processing architecture that enables execution of online autocalibration algorithms in single or multi-views. This architecture will be compliant with embedded system constraints (small footprint and low power consumption) and powerful enough to cope with the execution of applications with high reactivity requirements.
Application - Java Virtual Machine interaction for compilation
Offer N°: SL-DRT-15-0481
The PhD objective is to give access to low level code generation at the application level in a Java Virtual Machine (JVM). This objective become necessary because application performances are more and more sensitive to the data set characteristics and because it become difficult to use Java in embedded systems and/or high performance applications.
Advanced chemical characterisation of organic electronic materials and devices
Offer N°: SL-DRT-15-1107
The introduction of organic semiconductors in many new devices (LEDs, solar cells, bio-sensors…) will require characterization methods that do not destroy the structure of the material being analysed. In particular the chemical analysis of buried interfaces is a major scientific and technological challenge as these interfaces play an essential role in device performance.
Development of Scanning Thermal Microscopy for nanoscale characterization and its application to the thermal optimization of phase change memories.
Offer N°: SL-DRT-15-0093
This project aims at developing a Scanning Thermal Microscope (SThM) for the characterization of materials and structures at the nanometric scale. This represents an important challenge at the international level since few teams are today able of performing absolute measurements of temperature and heat flows at this scale. The actual resolution of the SThM developed up to now allows to investigate objects that are of the order of hundred nanometers.