Etch Process developement for sub 10nm FEOL applications
Offer N°: SL-DRT-15-0706
For the 10nm CMOS technology and beyond, 3D Si or SiGe nanowire devices are envisionned. Plasma etching plays a key role in the fabrication of these high performance devices but we are facing more complexity and atomistic scale dimension control. There is a need to develop processes meeting technology requirements: 2D and 3D profile control and film integrity with an atomic precision. The LETI just got a new etch tool allowing to solve these issues.
Quality of Service management for distrubuted embedded systems
Offer N°: SL-DRT-15-0659
One of the great challenges of intelligent building and smart home is the interconnection of so called smart objects, whether they are integrated to the building (building management systems, home networks) or specific to the user (brown goods, white goods, portable goods). This interconnection is made difficult by the variety of technologies and the multidisciplinary nature of the objects involved.
Compressive sensing and signal processing of sparse acoustic signals for sources detection, classification and localization
Offer N°: SL-DRT-15-0645
The objective of this PhD thesis is the monitoring of industrial electric systems. In particular, the focus is put on rare events detection with important failures on the system (as electric arcs) from a distributed acoustic sensors network. This PhD deals with the optimization of the following steps: signal digitalization, signal processing and data transmission. Those subjects lie in the context of compressive sensing and signal processing of compressed data.
Development of high resolution photo-modulated Kelvin Probe Force Microscopy for photovoltaics
Offer N°: SL-DRT-15-0619
Nowadays, improvements in performance of third generation solar cells are strongly dependent on developing advanced characterization tools capable of mapping the opto-electronic properties of photovoltaic (PV) materials at the nanometer scale. Within the Nano characterisation platform (PFNC), we develop advanced approach based on Atomic Force Microscopy (AFM) and its electrical modes such as Kelvin Probe Force Microscopy (KPFM).