FEG-TEM ribbon-cutting held at CMTC
Categorie(s) : Education, News, Research
Published : 2 February 2015
On January 19 researchers from across the Rhône-Alpes region attended a ribbon-cutting ceremony for the new FEG-TEM microscope on the St. Martin d’Hères campus. The microscope, manufactured by JEOL, offers spatial resolution of 2.3 Å in TEM mode and 2 Å in STEM mode. It also boasts powerful chemical imaging capabilities and is suitable for observing a broad range of metals, ceramics, and polymers.
The FEG-TEM microscope will be used about half the time for nanocharacterization. The rest of the time it will be used to develop new imaging methods—with nanometric resolution and large observation fields—that build on the advanced nanodiffraction tools developed under a joint research project between SIMaP and scientific instrumentation manufacturer NanoMEGAS.