IMEP-LaHC gets an AFM unlike any other
Categorie(s) : Life @ MINATEC, News, Research
Published : 3 December 2018
The new Bruker Icon AFM installed at IMEP-LaHC in late October offers conventional topographical measurement capabilities with resolutions of around a nanometer. There’s nothing revolutionary about that. However, the microscope does have some new capabilities that are not available anywhere else in Grenoble. The equipment’s “Data Cube” mode delivers point-by-point electrical and physical measurements across the entire surface of a sample. The sample can also be mapped in terms of current, voltage, and force curves.
Also new is “SMIM”* mode, which measures a sample’s capacity and resistivity with resolutions of 50 nm.
The new AFM will be operational in a few months. And, as part of the Open RA platform, outside researchers will be able to use the microscope.
*Scanning Microwave Impedance Microscopy