All News

October 01 2012

Phelma Junior Consultants kicks off new programs this autumn

  • Education
  • Life @ MINATEC
  • News
For the first time this year, Phelma Junior Consultants’ orientation program will be held over an activity-filled weekend at a chalet in the Vercors. During this weekend 20 new members will learn about the club’s different roles and committees (like president, treasurer, secretary, membership development, and communications), so they can decide how they would like […] >>

October 01 2012

MINATEC brings home five Innovative Business Start-up awards

  • Innovation & Society
  • Life @ MINATEC
  • MINATEC
  • News
Five MINATEC companies and business ideas in 2012—up from three in 2011—were recognized in an award ceremony for innovative new businesses as part of the French government’s program to finance start-ups. In the Business Creation & Development category, the two MINATEC-based winning companies are Wavelens, a maker of optical parts for miniature cameras (founded by […] >>

October 01 2012

Grenoble proves fertile ground for Atrenta

  • Industry
  • MINATEC
  • News
US-based Atrenta—the world’s fourth-leading provider of design software for the semiconductor industry—is actively expanding its French subsidiary based at MINATEC. This young business has already grown from four employees when it was created in early 2011 to 14 in June 2012, and plans to reach 20 by the end of the year.  This rapid business […] >>

October 01 2012

Grenoble Institute of Technology gains ground

  • Education
  • Life @ MINATEC
  • News
The new Grenoble Institute of Technology management team is continuing to implement the campus expansion plan established by the outgoing management team. As the largest higher education establishment in Grenoble’s Presqu’ile scientific district, the school aims to expand its presence in this research hub—of which MINATEC is a key player. By September 2014 Phelma engineering […] >>

October 01 2012

Breakthrough in measuring nanostructure dopant energy spectra

  • MINATEC
  • News
  • Research
One of the key challenges of nanoelectronics is measuring dopant energy spectra in silicon nanostructures, because at this scale energy levels depend largely on the surrounding environment—and the in situ measurement of a single dopant is extremely difficult. However an INAC-Leti team of researchers seem to have found a way to overcome this hurdle. They […] >>
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